Electronic component testing halt accelerated life testing
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China [CN] The High Acceleration Life Test Chamber (HAST chamber) is a reliability testing device that simulates extreme environments such as high temperature, high humidity, and high pressure to accelerate the aging process of products. Its core value lies in exposing potential defects of products in a short period of time, verifying durability, and optimizing the R&D process. It is widely used in fields such as chips, electronic components, and materials.
For example, in the chip industry, HAST testing can simulate the aging and performance decline of materials after long-term use, helping companies improve designs during the R&D stage and reduce market risks.
The working principle of the HAST chamber:
Composite stress accelerated aging. The HAST chamber achieves accelerated aging through the combined effect of temperature, humidity, and pressure. The specific mechanisms include: moisture penetration: high-pressure steam penetrates the product's sealing layer, causing internal material expansion or delamination (such as the "popcorn effect" in semiconductor packaging.)If you need more information about the models of our testing equipment. Please contact me. https://www.chamber-testing.com/a/d/HALT-HASS-test-chamber.html
Oxidation and hydrolysis: high temperature accelerates the decomposition of high-molecular materials, and humidity intensifies the electrochemical corrosion of metals.
Thermal shock fatigue: rapid temperature changes cause thermal expansion and contraction of materials, exposing potential hazards such as cracking at welding points.
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