Semiconductor halt testing Reliability Testing Equipment
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China [CN] HALT Testing is a testing method that rapidly triggers potential defects in products by applying stepwise stress factors such as temperature and vibration.
The results of the HALT test are mainly used to improve the design and manufacturing process of the product. If during the HALT test it is found that the product fails under a certain temperature or vibration condition, the R&D team will redesign the product or adjust the manufacturing process. For example, if it is discovered that the battery life of the product significantly decreases in a low-temperature environment, the battery management system may be optimized, or a more suitable battery material for low-temperature conditions may be replaced. These improvement measures will be reflected in the next design version of the product or in subsequent production batches.If you need more models about our test equipment, please reference our ： https://www.chamber-testing.com/a/d/HALT-HASS-test-chamber.html
Technical Specifications Combine temperature and vibration for stress testing Capacity：215 to 1100L（Customizable） Temperature Range：-100 to +200℃ Consistency: ≤20%(Higher than the industry standard) Heating &Cooling Rate (average)：70℃/min Vibration Frequency Range：5 to 10,000Hz Vibration range：5 to 100GRMS Vibration Overshoot：≤2GRMs Patent Number: CN201520670413.0
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