ICP5000 Inductive Coupled Plasma (ICP) OES Spectrometer

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Product
ICP5000 Inductive Coupled Plasma (ICP) OES Spectrometer
Posting date : Jun 12, 2018
Membership
Free Member Scince Jul 29, 2017
FOB Price
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Min. Order Quantity
1 set
Supply Abillity
500set/mouth
Port
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Payment Terms
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Package
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Contact
Li Manager
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Product Detail
Company Info
 
Quick Detail
Place of Origin
China [CN]
Brand Name
FPI
HS-CODE
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Package & Delivery Lead Time
Package
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Delivery Lead Time
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Detailed Description
ICP-5000 is a desktop innovative Inductively Coupled Plasma Optical Emission Spectrometer (ICP-OES) providing environmental, pharmaceutical, industrial and food safety fields with low cost of analysis and high-performance, which is not only the first full spectrum ICP-OES in China but also one of the leading analytical instruments in the world. With more than fifty thousand spectrums in library, up to 72 elements can be analyzed simultaneously. Two-dimensional echelle optical system, free running solid state RF source and high-speed CCD data acquisition enable ICP-5000 the ideal solution for laboratories.
Technical
    Optical System 
     •Optical resolution:0.007nm at 200nm     •Pixel resolution: 0.002nm/pixel at 200nm     •Wavelength range:165-870nm
     Argon Consumption     •Typical 12L/min
    Detector
    •Back-illuminated area-array CCD    •Spill-proof     •Mega pixels    •Noise: 2.0e-rms
    RF Source
     •Free-running solid state RF Source     •Power: 700-1600W
     Dimension     •L x W x H: 935mm×732mm×659 mm     •Weight : 98 kg
     Power and Environmental      •AC 220±10% V, 50~60 Hz     •Room Temperature: 10℃-30℃     •Relative Humidity: 20 % ~ 80% RH     •Power Consumption:≤4.5KW
ICP OES , Inductive Coupled Plasma (ICP) OES Spectrometer hot sale,ICP OES Spectrometers Features
 
Dual View and Echelle Optical System     • Stabilized optical system,constant temperature of 36℃,independent air duct.     • Flexible configurations, radial view to eliminate matrix interference effectively for complex matrix; dual view to lower detection limit for trace elements analysis, and keep less interference.
 
CCD Data Acquisition System     • High Speed CCD Detector, back-illuminated, independent encapsulation.     • High response in UV band, available for Al 167.     • Tertiary TEC refrigeration with low noise signals and high dynamic range.     • Spill proof, high resolution with mega pixels.condensation     • Water cooling and argon purging prevent CCD 
Precise Plasma and Torch Chamber     • Free-running 27.12 MHz solid state RF source.     • Frequency conversion design enables automatic plasma match.     • Water cooling, power and temperature interlock protection.     • Torch Chamber enables viewing of the plasma and inspecting.
Integrated Argon Controller with Low Gas Consumption     • Patented and intelligent multi-duct optic purging.     • Compact, efficient and well-sealed optic design.     • Optimized torch design to save cooling gas.     
Smooth Sampling System     • Peristaltic pump with three-channel 12 roller.     • 3 line MFC control plasma gas, precision≤0.5%.     • High precision purge gas monitoring.
Demountable Torch     • Different central tubes for various applications.     • Automatic collimation to assemble.     • Automatic air flow connection with no leakage.     • Easy assemble with bayonet

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